| 9:00 AM |
45 Mins |
Christopher Almeras, Sr. Principal Engineer, ESD Technologist, Raytheon, United States |
Optimizing the Effectiveness of an ESD Control Program Through Enhanced Training (Keynote*) |
| 9:45 AM |
45 Mins |
Dr. Charvaka Duvvury, IEEE Fellow, iT2 Technologies |
Celebrating 20 Years of Influencing ESD Targets, Standards, and Test Methods (Keynote) |
| 10:30 AM |
30 Mins |
Dr. Mirko Scholz, Principal Engineer, Infineon Technologies AG, Germany |
The ESDA Technology Roadmap (Invited) |
| 11:00 AM |
30 Mins |
Break |
| 11:30 AM |
30 Mins |
Prof. Isabella Rossetto, Associate Professor, University of Padova - Department of Information Engineering, Italy |
Investigation of ESD effects on normally-off p-GaN gate power HEMTs by TLP analysis and numerical simulation (Invited) |
| 12:00 PM |
30 Mins |
Dr. Matteo Buffolo, Assistant Professor, University of Padova - Department of Information Engineering, Italy |
Effects of ESDs on GaN LEDs: a device perspective (Invited) |
| 12:30 PM |
30 Mins |
Dr. Milind Furia, Member of Technical Staff, IP Design, Micron Technology, USA |
Need for reducing ESD targets for Memory Components (Invited) |
| 1:00 PM |
90 Mins |
Networking Lunch |
| 2:30 PM |
30 Mins |
Dr.-Ing. Andreas Hardock, Sr. Principal Product Application Engineer, Nexperia Germany GmbH, Germany |
Optimizing Signal Integrity when Using ESD Protection Devices (Invited) |
| 3:00 PM |
30 Mins |
Dr. Sergej Bub, Principal System Level ESD Expert, Nexperia Germany GmbH, Germany |
High-Speed Interface Design – Balancing Signal Integrity and ESD Robustness. Part 2: Optimizing ESD Robustness (Invited) |
| 3:30 PM |
30 Mins |
Dr. Joost Willemen, Senior Principal, Infineon Technologies, Germany |
Characterizing TVS Devices for Antenna Protection: ESD Robustness Meets RF Linearity (Invited) |
| 4:00 PM |
30 Mins |
Coffee Break |
| 4:30 PM |
10 Mins |
Mr. M M C Kishore, Founder and CEO, Global Marketing Services |
Tools for Emerging Technologies in chip fabrication, assembly and characterization (Platform Presentation) |
| 4:40 PM |
10 Mins |
Mr. Thomas Tatry, Application Engineer, SENTECH Instruments, Germany |
SENTECH Instruments - Experts in Plasma process and thin Film metrology (Platform Presentation) |
| 4:50 PM |
10 Mins |
Mr. Sabarigresan Murugan, Application Scientist, Park Systems India |
Nanoscale Failure analysis using AFM (Platform Presentation) |
| 5:00 PM |
15 Mins |
Dr. Vasu Duvvury, Professor (Retired), University of North Texas, USA |
Art and Symbolism of the Hand Fan: Its Global and Historical Importance (Contributed Talk) |
| 5:15 PM |
15 Mins |
Mr. Harshit Dhakad, Intel |
From simulation to silicon: RF ESD Design and characterization for Wifi tranceiver (Contributed Talk) |
| 5:30 PM |
15 Mins |
Mr. Srinivasamuni Adepu, Senior IO layout Manager, Mixed Singal IP group, ASIC, SanDisk Corporation |
ESD Protection: Layout Challenges, Verification, and Silicon Learnings (Contributed Talk) |
| 5:45 PM |
15 Mins |
Mr. Prashanth, Staff Engineer - ESD Engineer, Marvell Technology |
3D ESD PERC Verification in Advanced Packaging (Contributed Talk) |
| 6:00 PM |
15 Mins |
TBD |
TBD (Contributed Talk) |
| 6:15 PM |
15 Mins |
TBD |
TBD (Platform Presentation) |
| 6:30 PM |
15 Mins |
Concluding Remarks & Vote of Thanks & 8th InEW Announcement |
| 6:45 PM |
15 Mins |
Networking, Poster, Hi-tea, and See You @ 8th InEW |
